New Enhanced Agilent Nano Suit

Features and Benefits
? New test method development
offers easier, more user-friendly
protocol scripting
? Enhanced imaging capabilities,
including pro? le cross-sectional
imaging, real-time adjustment of
scanning parameters, plane-? t
leveling, and more
? Survey scanning option allows
scanning of areas up to
500 μm x 500 μm
? Experiment data analysis using
the most powerful, comprehensive
software
? Support of small force / small
displacement measurements,
from MEMS testing to tensile
experiments, surface topology,
polymers, and more
? Simulation mode enables of? ine
sample setup, sample runs, method
writing, and data analysis
? Integrated 2D plotting tool with
easy-to-read statistical analysis
? Analyst software assists data
analysis, software updates provide
the latest improvements, and
System Agent enables automatic
software reporting